Variation-Tolerant Voltage Over-Scalable Design with Critical Path Isolation and Bit-Width Scaling

Variation-Tolerant Voltage Over-Scalable Design with Critical Path Isolation and Bit-Width Scaling

Yutaka Masuda

Yutaka Masuda received the B.E., M.E., and Ph.D. degrees in Information Systems Engineering from the Osaka University,Osaka, Japan, in 2014, 2016, and 2019, respectively. He is currently an Assistant Professor in Center for Embedded Computing Systems, Graduate School of Informatics, Nagoya University. His research interests include low-power circuit design and testing. He is a member of IEEE, IEICE, and IPSJ.
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